Our own Shaun Pewsey was quoted extensively in the May issue of Solid State Technology in an article on page 10 titled, "New MFCs Mean Higher Yield." The article discusses the latest advances in diagnostics for semiconductor production.
Brooks' new GF135 is featured because it is the first MFC that can test process gas flow without stopping production. Instead of having to take the gas panel offline to run diagnostics, the GF135 uses real-time error detection by momentarily closing the valve. This promises semiconductor manufacturers increased accuracy and increased yield. "In short, the new technology identifies and corrects issues before they happen, preventing wasted time and wasted wafers."
We hope you enjoy the article. Give it a read
here.